From Book News, Inc.
A continuation of HOC I, including 40 new materials that were not in the previous volume. Fourteen chapters describe optical properties and how to measure n and k in various spectral regions. The first part focuses on the determination of optical constants, and the second contains a series of critiques. No index. Annotation copyright Book News, Inc. Portland, Or.--This text refers to the
Guide to Energy Management |
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From Book News, Inc.
In 1992, industrial engineers Capehart (U. of Florida-Gainesville) and Wayne C. Turner (Oklahoma State U.) joined colleague William J. Kennedy (Clemson U.) to revise his 1984 Energy Management and the three have worked together through all three editions of the resulting textbook for business students and guide for managers. A new chapter ties maintenance into the energy management program described, emphasizing the significant role that maintenance shou... >> |
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Semiconductor Material and Device Characterization |
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From Book News, Inc.
Devoted to the characterization techniques used by the modern semiconductor industry to measure diverse semiconductor materials and devices. Coverage includes the full range of electrical and optical characterization methods; more specialized chemical and physical techniques; and innovations such as scanning probe techniques, the detection of metallic impurities in silicon wafers, and the use of microwave reflection to measure contactless resistivity. A new chap... >> |
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